The Proforma 300 is based on MTI Instruments' proprietary capacitance technology and can be used on all wafer materials including:

• Silicon

• Gallium-Arsenide

• Indium Phosphide

• Germanium

... without recalibrating or electrically grounding the wafer!

• Fast, Accurate, and Reliable, the Proforma 300 measures wafers up to 300 mm in diameter for both thickness and total thickness variation (TTV)
  

• Portable and Easy to Set Up, the Proforma 300 provides the user precise non-contact measurements at critical points throughout the wafer manufacturing process.

Thickness and TTV values are obtained by placing the wafer between the non-contact capacitance probes. The Teflon coated wafer stage allows for easy, non-abrasive positioning of the wafer, while removable locating pins can be utilized for precise center thickness measurements. Thickness and TTV values are indicated on the high resolution LCD display.
 

	Menu-driven for Fast, Easy Setup.
	Proprietary Push-PullTM Probe Technology.
	High-resolution LCD Display.
	On-board Microprocessor for Accurate, Repeatable Measurements.
	Bubble Level.
	Adjustable Stage for Precise Leveling.
	Teflon Wafer Stage for Easy, Non-abrasive Positioning.

Specifications: